{"id":4039,"date":"2022-05-02T18:02:45","date_gmt":"2022-05-02T18:02:45","guid":{"rendered":"https:\/\/mooser-consulting.de\/services\/semiconductor-measurement\/"},"modified":"2022-07-15T07:34:06","modified_gmt":"2022-07-15T07:34:06","slug":"semiconductor-measurement","status":"publish","type":"page","link":"https:\/\/mooser-consulting.de\/en\/services\/semiconductor-measurement\/","title":{"rendered":"EMC measurements of semiconductors"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"4039\" class=\"elementor elementor-4039 elementor-2533\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-4b254e4 elementor-section-full_width elementor-section-height-min-height elementor-section-height-default elementor-section-items-middle\" data-id=\"4b254e4\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-56f572e\" data-id=\"56f572e\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-6f8533c elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"6f8533c\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-27cfa1c\" data-id=\"27cfa1c\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-6a3dd04 elementor-align-left auszeichnung auszeichnung-b elementor-widget elementor-widget-breadcrumbs\" data-id=\"6a3dd04\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"breadcrumbs.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<nav id=\"breadcrumbs\"><span><span><a href=\"https:\/\/mooser-consulting.de\/en\/\">Home<\/a><\/span><\/span><\/nav>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-e80b02b elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"e80b02b\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-918716e\" data-id=\"918716e\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-84ea25f mos-big elementor-widget elementor-widget-heading\" data-id=\"84ea25f\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">EMC measurements on semiconductors <\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-c7bcdef elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"c7bcdef\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-31d0c27\" data-id=\"31d0c27\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-c053706 mos-mid elementor-widget elementor-widget-text-editor\" data-id=\"c053706\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<div id=\"idTextPanel\" class=\"jqDnR\"><p>In our laboratories, we carry out EMC measurements of semiconductors in accordance with all the worldwide standards and guidelines. This is how we find out whether the microelectronic components are emitting electromagnetic interference or are being disturbed by external influences.<\/p><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-c0b3446 elementor-widget elementor-widget-text-editor\" data-id=\"c0b3446\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Semiconductors in integrated circuits and power electronics are responsible for calculating and distributing data and information in our increasingly digital world. Everyone needs them, but hardly anyone ever sees them. So how can we tell in advance whether these microelectronic components are \u201chealthy\u201d and functioning correctly? <br>This is the job of the specialists at Mooser who perform accurate and comprehensive EMC measurements of semiconductors. <\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-0b57961\" data-id=\"0b57961\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-e83a4b4 elementor-section-full_width elementor-section-height-min-height elementor-section-height-default elementor-section-items-middle\" data-id=\"e83a4b4\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-435a097\" data-id=\"435a097\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-a700dbe elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"a700dbe\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-no\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-7a89297\" data-id=\"7a89297\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-fa45a57 elementor-widget elementor-widget-heading\" data-id=\"fa45a57\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h3 class=\"elementor-heading-title elementor-size-default\">Measurement methods, technology and infrastructure\nSpecial measurement environments for semiconductors<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-2f51cf7 elementor-widget elementor-widget-text-editor\" data-id=\"2f51cf7\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Mooser provides the necessary measurement environments and methods for EMC testing. For example, individual semiconductors are tested for emissions and immunity to interference in the \u00b5TEM cell (transverse electromagnetic cell). <a href=\"https:\/\/mooser-consulting.de\/en\/services\/shielding-attenuation\/\">This is also possible one size smaller on the IC Stripline, a test board that is only 17 by 12 centimeters in size. If necessary, the \u00b5TEM cell and IC stripline can be protected from external influences with a shielding box<\/a>. For larger test specimens, such as complete control units, and for even more comprehensive measurements, we use our chambers, which allow almost any type of electromagnetic interference to be identified.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-c037ede\" data-id=\"c037ede\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-41ac2e6 elementor-widget elementor-widget-heading\" data-id=\"41ac2e6\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-heading-title elementor-size-default\">17 by 12 <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-68d1853 elementor-widget elementor-widget-heading\" data-id=\"68d1853\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-heading-title elementor-size-default\">Centimetres IC stripline for \nsemiconductor measurements<\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-ed84601 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"ed84601\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-no\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-79712c1\" data-id=\"79712c1\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-3b93c9d elementor-widget elementor-widget-heading\" data-id=\"3b93c9d\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h4 class=\"elementor-heading-title elementor-size-default\">The standards for measuring semiconductors<\/h4>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-9293e7a elementor-widget elementor-widget-text-editor\" data-id=\"9293e7a\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>It is important to make the distinction between emissions of interference and immunity to external interference. Interference emitted by semiconductors is measured on the basis of EN 61967-2 and SAE J1752-3 in the \u00b5TEM cell. Mooser is one of the few automotive service providers in the world to offer these measurements as a service. Other measurements are carried out in accordance with EN 61967-4 (measurement of the 1 ohm\/150 ohm direct coupling to each network pin) and EN 61967-5 (magnetic probe method). Standards such as IEC 61967-3 (surface scanning with a small probe) and IEC 61967-8 (the IC stripline method, which is offered by very few automotive service providers) can also be used to determine EMC emissions.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-534875f\" data-id=\"534875f\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-7c90bb7 elementor-widget elementor-widget-text-editor\" data-id=\"7c90bb7\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"background-color: var( --e-global-color-1aab2c3 ); font-family: -apple-system, BlinkMacSystemFont, 'Segoe UI', Roboto, 'Helvetica Neue', Arial, 'Noto Sans', sans-serif; font-size: 1rem;\">In the case of measurements of interference immunity, which in principle is the reverse of the process for interference emissions, pulses of external interference are applied to the semiconductor and its reaction to them is tested. The main standards in this area are EN 62132-2 (\u00b5TEM cell tests), EN 62132-3 (bulk current injection (BCI) method) and EN 62132-4 (direct power injection from the amplifier to the pins of the semiconductor). Tests based on IEC 62132-8 (semiconductor stripline method) and IEC 62215-3 (test with conducted electrical transient disturbances) can also indicate whether the semiconductors are functioning reliably. Transceivers connected to the LIN and CAN data networks are tested in accordance with SAE J2962-1 (LIN) and SAE J2962-2 (CAN) for interference emissions and immunity.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-2d056ca elementor-section-full_width elementor-section-height-min-height elementor-section-height-default elementor-section-items-middle\" data-id=\"2d056ca\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-dfccb64\" data-id=\"dfccb64\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-b2fe6fe elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"b2fe6fe\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-4fc306c\" data-id=\"4fc306c\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-07012df elementor-widget elementor-widget-heading\" data-id=\"07012df\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h3 class=\"elementor-heading-title elementor-size-default\">Mooser provides the measurement technology, support and understanding of customers\u2019 needs.<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-518c6a3 elementor-widget elementor-widget-text-editor\" data-id=\"518c6a3\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Demand for our semiconductor measurements services has increased significantly over recent years. Because the automotive industry in particular has come to the realisation that malfunctions of semiconductors and control units caused by EMC can lead to serious safety risks, in particular in safety-related systems, such as airbags, steering units and automated driving functions. In addition, semiconductors are becoming increasingly complex and have a growing number of functions.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-a5675be\" data-id=\"a5675be\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-f5158bf elementor-widget elementor-widget-text-editor\" data-id=\"f5158bf\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"background-color: var( --e-global-color-8cf8a8e ); font-family: -apple-system, BlinkMacSystemFont, 'Segoe UI', Roboto, 'Helvetica Neue', Arial, 'Noto Sans', sans-serif; font-size: 1rem;\">We are one of the few service providers to offer customers a complete portfolio of semiconductor measurements, which range from testing the smallest semiconductor through to measurements of complex control units with several processors. We provide everything you need: not only the professional measurements and accurate results, but also the accompanying services. We assign you a highly qualified project leader as your permanent point of contact to handle all your requirements. You simply need to tell us about the semiconductor testing services you need and we do the rest. Including <a href=\"https:\/\/mooser-consulting.de\/en\/services\/emc-consulting\/\">providing consultancy on the design of the test board, the measurement set-up and the results and an assessment of the impact on your ongoing semiconductor development process.<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-1613b28 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"1613b28\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-e0e07ef\" data-id=\"e0e07ef\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-20ff9da elementor-widget-divider--view-line elementor-widget elementor-widget-divider\" data-id=\"20ff9da\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-b3cd81d elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"b3cd81d\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-83e51a9\" data-id=\"83e51a9\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-3b73b21 elementor-widget elementor-widget-heading\" data-id=\"3b73b21\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h4 class=\"elementor-heading-title elementor-size-default\">Frequently asked Questions<\/h4>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-dc6734c elementor-widget elementor-widget-toggle\" data-id=\"dc6734c\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"toggle.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-toggle\">\n\t\t\t\t\t\t\t<div class=\"elementor-toggle-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2311\" class=\"elementor-tab-title\" data-tab=\"1\" role=\"button\" aria-controls=\"elementor-tab-content-2311\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon elementor-toggle-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon-closed\"><i class=\"icon icon-down-open-big\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon-opened\"><i class=\"elementor-toggle-icon-opened icon icon-up-open-big\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-toggle-title\" tabindex=\"0\">Why semiconductor measurements at all?<\/a>\n\t\t\t\t\t<\/div>\n\n\t\t\t\t\t<div id=\"elementor-tab-content-2311\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"1\" role=\"region\" aria-labelledby=\"elementor-tab-title-2311\"><p>Semiconductors in integrated circuits and power electronics are responsible for calculating and distributing data and information in our increasingly digital world. Industries such as automotive have recognized that EMC-based malfunctions in semiconductors and control units can trigger serious safety risks, especially in safety-relevant systems such as airbags, steering and automated driving functions. In addition, semiconductors are becoming increasingly complex and have a growing number of functions. This is why EMC measurements on semiconductor elements are urgently required so that the highly complex electronic systems function reliably.<\/p><\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-toggle-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2312\" class=\"elementor-tab-title\" data-tab=\"2\" role=\"button\" aria-controls=\"elementor-tab-content-2312\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon elementor-toggle-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon-closed\"><i class=\"icon icon-down-open-big\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon-opened\"><i class=\"elementor-toggle-icon-opened icon icon-up-open-big\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-toggle-title\" tabindex=\"0\">Which standards does Mooser follow for semiconductor measurement?<\/a>\n\t\t\t\t\t<\/div>\n\n\t\t\t\t\t<div id=\"elementor-tab-content-2312\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"2\" role=\"region\" aria-labelledby=\"elementor-tab-title-2312\"><p>It is important to make the distinction between emissions of interference and immunity to external interference. Interference emitted by semiconductors is measured on the basis of EN 61967-2 and SAE J1752-3 in the \u00b5TEM cell. Mooser is one of the few automotive service providers in the world to offer these measurements as a service. Other measurements are carried out in accordance with EN 61967-4 (measurement of the 1 ohm\/150 ohm direct coupling to each network pin) and EN 61967-5 (magnetic probe method). Standards such as IEC 61967-3 (surface scanning with a small probe) and IEC 61967-8 (the IC stripline method, which is offered by very few automotive service providers) can also be used to determine EMC emissions. <br>In the case of measurements of interference immunity, which in principle is the reverse of the process for interference emissions, pulses of external interference are applied to the semiconductor and its reaction to them is tested. The main standards in this area are EN 62132-2 (\u00b5TEM cell tests), EN 62132-3 (bulk current injection (BCI) method) and EN 62132-4 (direct power injection from the amplifier to the pins of the semiconductor). Tests based on IEC 62132-8 (semiconductor stripline method) and IEC 62215-3 (test with conducted electrical transient disturbances) can also indicate whether the semiconductors are functioning reliably. Transceivers connected to the LIN and CAN data networks are tested in accordance with SAE J2962-1 (LIN) and SAE J2962-2 (CAN) for interference emissions and immunity.<\/p><\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-toggle-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2313\" class=\"elementor-tab-title\" data-tab=\"3\" role=\"button\" aria-controls=\"elementor-tab-content-2313\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon elementor-toggle-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon-closed\"><i class=\"icon icon-down-open-big\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-toggle-icon-opened\"><i class=\"elementor-toggle-icon-opened icon icon-up-open-big\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-toggle-title\" tabindex=\"0\">Which technology does Mooser use for semiconductor measurement?<\/a>\n\t\t\t\t\t<\/div>\n\n\t\t\t\t\t<div id=\"elementor-tab-content-2313\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"3\" role=\"region\" aria-labelledby=\"elementor-tab-title-2313\"><p>Mooser provides the necessary measurement environments and methods for EMC testing. For example, individual semiconductors are tested for emissions and immunity to interference in the \u00b5TEM cell (transverse electromagnetic cell). This is also possible one size smaller on the IC Stripline, a test board that is only 17 by 12 centimeters in size. If necessary, the \u00b5TEM cell and IC stripline can be protected from external influences with a shielding enclosure. For larger test specimens, such as complete control units, and for even more comprehensive measurements, we use our chambers, which allow almost any type of electromagnetic interference to be identified.<\/p><\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<script type=\"application\/ld+json\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@type\":\"FAQPage\",\"mainEntity\":[{\"@type\":\"Question\",\"name\":\"Why semiconductor measurements at all?\",\"acceptedAnswer\":{\"@type\":\"Answer\",\"text\":\"<p>Semiconductors in integrated circuits and power electronics are responsible for calculating and distributing data and information in our increasingly digital world. Industries such as automotive have recognized that EMC-based malfunctions in semiconductors and control units can trigger serious safety risks, especially in safety-relevant systems such as airbags, steering and automated driving functions. In addition, semiconductors are becoming increasingly complex and have a growing number of functions. This is why EMC measurements on semiconductor elements are urgently required so that the highly complex electronic systems function reliably.<\\\/p>\"}},{\"@type\":\"Question\",\"name\":\"Which standards does Mooser follow for semiconductor measurement?\",\"acceptedAnswer\":{\"@type\":\"Answer\",\"text\":\"<p>It is important to make the distinction between emissions of interference and immunity to external interference. Interference emitted by semiconductors is measured on the basis of EN 61967-2 and SAE J1752-3 in the \\u00b5TEM cell. Mooser is one of the few automotive service providers in the world to offer these measurements as a service. Other measurements are carried out in accordance with EN 61967-4 (measurement of the 1 ohm\\\/150 ohm direct coupling to each network pin) and EN 61967-5 (magnetic probe method). Standards such as IEC 61967-3 (surface scanning with a small probe) and IEC 61967-8 (the IC stripline method, which is offered by very few automotive service providers) can also be used to determine EMC emissions. <br>In the case of measurements of interference immunity, which in principle is the reverse of the process for interference emissions, pulses of external interference are applied to the semiconductor and its reaction to them is tested. The main standards in this area are EN 62132-2 (\\u00b5TEM cell tests), EN 62132-3 (bulk current injection (BCI) method) and EN 62132-4 (direct power injection from the amplifier to the pins of the semiconductor). Tests based on IEC 62132-8 (semiconductor stripline method) and IEC 62215-3 (test with conducted electrical transient disturbances) can also indicate whether the semiconductors are functioning reliably. Transceivers connected to the LIN and CAN data networks are tested in accordance with SAE J2962-1 (LIN) and SAE J2962-2 (CAN) for interference emissions and immunity.<\\\/p>\"}},{\"@type\":\"Question\",\"name\":\"Which technology does Mooser use for semiconductor measurement?\",\"acceptedAnswer\":{\"@type\":\"Answer\",\"text\":\"<p>Mooser provides the necessary measurement environments and methods for EMC testing. For example, individual semiconductors are tested for emissions and immunity to interference in the \\u00b5TEM cell (transverse electromagnetic cell). This is also possible one size smaller on the IC Stripline, a test board that is only 17 by 12 centimeters in size. If necessary, the \\u00b5TEM cell and IC stripline can be protected from external influences with a shielding enclosure. For larger test specimens, such as complete control units, and for even more comprehensive measurements, we use our chambers, which allow almost any type of electromagnetic interference to be identified.<\\\/p>\"}}]}<\/script>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>In our laboratories, we carry out EMC measurements of semiconductors in accordance with all the worldwide standards and guidelines. We can determine whether microelectronic components are emitting electromagnetic interference or are susceptible to interference from external sources. <\/p>\n","protected":false},"author":1,"featured_media":3439,"parent":3956,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"footnotes":""},"class_list":["post-4039","page","type-page","status-publish","has-post-thumbnail","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>EMC measurements of semiconductors &#8211; Jakob Mooser GmbH<\/title>\n<meta name=\"description\" content=\"In our laboratories, we carry out EMC measurements of semiconductors in accordance with all the worldwide standards and guidelines. 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