EMC measurements on semiconductors
In our laboratories, we carry out EMC measurements of semiconductors in accordance with all the worldwide standards and guidelines. This is how we find out whether the microelectronic components are emitting electromagnetic interference or are being disturbed by external influences.
Semiconductors in integrated circuits and power electronics are responsible for calculating and distributing data and information in our increasingly digital world. Everyone needs them, but hardly anyone ever sees them. So how can we tell in advance whether these microelectronic components are “healthy” and functioning correctly?
This is the job of the specialists at Mooser who perform accurate and comprehensive EMC measurements of semiconductors.
Measurement methods, technology and infrastructure Special measurement environments for semiconductors
Mooser provides the necessary measurement environments and methods for EMC testing. For example, individual semiconductors are tested for emissions and immunity to interference in the µTEM cell (transverse electromagnetic cell). This is also possible one size smaller on the IC Stripline, a test board that is only 17 by 12 centimeters in size. If necessary, the µTEM cell and IC stripline can be protected from external influences with a shielding box. For larger test specimens, such as complete control units, and for even more comprehensive measurements, we use our chambers, which allow almost any type of electromagnetic interference to be identified.
The standards for measuring semiconductors
It is important to make the distinction between emissions of interference and immunity to external interference. Interference emitted by semiconductors is measured on the basis of EN 61967-2 and SAE J1752-3 in the µTEM cell. Mooser is one of the few automotive service providers in the world to offer these measurements as a service. Other measurements are carried out in accordance with EN 61967-4 (measurement of the 1 ohm/150 ohm direct coupling to each network pin) and EN 61967-5 (magnetic probe method). Standards such as IEC 61967-3 (surface scanning with a small probe) and IEC 61967-8 (the IC stripline method, which is offered by very few automotive service providers) can also be used to determine EMC emissions.
In the case of measurements of interference immunity, which in principle is the reverse of the process for interference emissions, pulses of external interference are applied to the semiconductor and its reaction to them is tested. The main standards in this area are EN 62132-2 (µTEM cell tests), EN 62132-3 (bulk current injection (BCI) method) and EN 62132-4 (direct power injection from the amplifier to the pins of the semiconductor). Tests based on IEC 62132-8 (semiconductor stripline method) and IEC 62215-3 (test with conducted electrical transient disturbances) can also indicate whether the semiconductors are functioning reliably. Transceivers connected to the LIN and CAN data networks are tested in accordance with SAE J2962-1 (LIN) and SAE J2962-2 (CAN) for interference emissions and immunity.
Mooser provides the measurement technology, support and understanding of customers’ needs.
Demand for our semiconductor measurements services has increased significantly over recent years. Because the automotive industry in particular has come to the realisation that malfunctions of semiconductors and control units caused by EMC can lead to serious safety risks, in particular in safety-related systems, such as airbags, steering units and automated driving functions. In addition, semiconductors are becoming increasingly complex and have a growing number of functions.
We are one of the few service providers to offer customers a complete portfolio of semiconductor measurements, which range from testing the smallest semiconductor through to measurements of complex control units with several processors. We provide everything you need: not only the professional measurements and accurate results, but also the accompanying services. We assign you a highly qualified project leader as your permanent point of contact to handle all your requirements. You simply need to tell us about the semiconductor testing services you need and we do the rest. Including providing consultancy on the design of the test board, the measurement set-up and the results and an assessment of the impact on your ongoing semiconductor development process.
Frequently asked Questions
Semiconductors in integrated circuits and power electronics are responsible for calculating and distributing data and information in our increasingly digital world. Industries such as automotive have recognized that EMC-based malfunctions in semiconductors and control units can trigger serious safety risks, especially in safety-relevant systems such as airbags, steering and automated driving functions. In addition, semiconductors are becoming increasingly complex and have a growing number of functions. This is why EMC measurements on semiconductor elements are urgently required so that the highly complex electronic systems function reliably.
It is important to make the distinction between emissions of interference and immunity to external interference. Interference emitted by semiconductors is measured on the basis of EN 61967-2 and SAE J1752-3 in the µTEM cell. Mooser is one of the few automotive service providers in the world to offer these measurements as a service. Other measurements are carried out in accordance with EN 61967-4 (measurement of the 1 ohm/150 ohm direct coupling to each network pin) and EN 61967-5 (magnetic probe method). Standards such as IEC 61967-3 (surface scanning with a small probe) and IEC 61967-8 (the IC stripline method, which is offered by very few automotive service providers) can also be used to determine EMC emissions.
In the case of measurements of interference immunity, which in principle is the reverse of the process for interference emissions, pulses of external interference are applied to the semiconductor and its reaction to them is tested. The main standards in this area are EN 62132-2 (µTEM cell tests), EN 62132-3 (bulk current injection (BCI) method) and EN 62132-4 (direct power injection from the amplifier to the pins of the semiconductor). Tests based on IEC 62132-8 (semiconductor stripline method) and IEC 62215-3 (test with conducted electrical transient disturbances) can also indicate whether the semiconductors are functioning reliably. Transceivers connected to the LIN and CAN data networks are tested in accordance with SAE J2962-1 (LIN) and SAE J2962-2 (CAN) for interference emissions and immunity.
Mooser provides the necessary measurement environments and methods for EMC testing. For example, individual semiconductors are tested for emissions and immunity to interference in the µTEM cell (transverse electromagnetic cell). This is also possible one size smaller on the IC Stripline, a test board that is only 17 by 12 centimeters in size. If necessary, the µTEM cell and IC stripline can be protected from external influences with a shielding enclosure. For larger test specimens, such as complete control units, and for even more comprehensive measurements, we use our chambers, which allow almost any type of electromagnetic interference to be identified.
